JPS644141B2 - - Google Patents

Info

Publication number
JPS644141B2
JPS644141B2 JP2268082A JP2268082A JPS644141B2 JP S644141 B2 JPS644141 B2 JP S644141B2 JP 2268082 A JP2268082 A JP 2268082A JP 2268082 A JP2268082 A JP 2268082A JP S644141 B2 JPS644141 B2 JP S644141B2
Authority
JP
Japan
Prior art keywords
light
measured
amount
mounting table
standard
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP2268082A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58140609A (ja
Inventor
Shigeru Ogawa
Hiroshi Yamaji
Katsuya Okumura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57022680A priority Critical patent/JPS58140609A/ja
Priority to US06/404,899 priority patent/US4583861A/en
Publication of JPS58140609A publication Critical patent/JPS58140609A/ja
Publication of JPS644141B2 publication Critical patent/JPS644141B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4704Angular selective
    • G01N2021/4711Multiangle measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8422Investigating thin films, e.g. matrix isolation method

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP57022680A 1981-08-12 1982-02-17 表面状態評価装置 Granted JPS58140609A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP57022680A JPS58140609A (ja) 1982-02-17 1982-02-17 表面状態評価装置
US06/404,899 US4583861A (en) 1981-08-12 1982-08-03 Surface condition judging apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57022680A JPS58140609A (ja) 1982-02-17 1982-02-17 表面状態評価装置

Publications (2)

Publication Number Publication Date
JPS58140609A JPS58140609A (ja) 1983-08-20
JPS644141B2 true JPS644141B2 (en]) 1989-01-24

Family

ID=12089570

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57022680A Granted JPS58140609A (ja) 1981-08-12 1982-02-17 表面状態評価装置

Country Status (1)

Country Link
JP (1) JPS58140609A (en])

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61270642A (ja) * 1985-05-25 1986-11-29 Japan Spectroscopic Co 拡散反射オ−トサンプラ−
DE3526553A1 (de) * 1985-07-25 1987-01-29 Zeiss Carl Fa Remissionsmessgeraet zur beruehrungslosen messung
ES2235608B1 (es) * 2003-07-15 2006-11-01 Consejo Sup. De Invest. Cientificas Metodo optico y dispositivo para la cuantificacion de la textura en celulas fotovoltaicas.
GB201312913D0 (en) 2013-07-18 2013-09-04 Perkinelmer Ltd Sample spinners and spectrometers including sample spinners

Also Published As

Publication number Publication date
JPS58140609A (ja) 1983-08-20

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